| 000 | 00719nam a2200241 a 4500 | ||
|---|---|---|---|
| 008 | |||
| 020 | _a0070542732 (pbk.) | ||
| 049 | _aMAIN | ||
| 090 |
_aQC611.24 _bRUN |
||
| 100 | 1 | _aRunyan, W. R. | |
| 245 | 1 | 0 |
_aSemiconductor measurements and instrumentation / _cW. R. Runyan. |
| 260 |
_aNew York : _bMcGraw-Hill, _c1975 |
||
| 300 |
_avii, 280 p. : _bill. ; _c26 cm. |
||
| 440 | 0 | _aTexas Instruments electronics series. | |
| 504 | _aIncludes bibliographical references. | ||
| 500 | _aIncludes index. | ||
| 650 | 0 | _aSemiconductors. | |
| 907 |
_a.b10032617 _b26-09-06 _c17-04-03 |
||
| 003 | |||
| 005 | 20230123133153.0 | ||
| 040 | _cNUST | ||
| 942 |
_cBOOKS _kQC611.24 _mRUN |
||
| 999 |
_c143952 _d143952 |
||