<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[NUST Library Search for 'su:&quot;Scanning electron microscopy&quot;']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20electron%20microscopy%22&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20electron%20microscopy%22&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:&quot;Scanning electron microscopy&quot;' at NUST Library]]> </description> <opensearch:totalResults>2</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Scanning%20electron%20microscopy%22&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Scanning%2520electron%2520microscopy%2522" startPage="" /> <item> <title> Scanning electron microscopy and x-ray microanalysis / </title> <dc:identifier>ISBN:047191391X (pbk.) </dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=97377</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Lawes, Graham..<br /> Chichester [West Sussex] : Published on behalf of ACOL, Thames Polytecnic, London, by Wiley, 1987 .<br /> xvii, 103 p., [1] leaf of plate : 23 cm..<br /> 047191391X (pbk.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=97377">Place hold on <em>Scanning electron microscopy and x-ray microanalysis /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=97377</guid> </item> <item> <title> Electron microprobe analysis and scanning electron microscopy in geology / </title> <dc:identifier>ISBN:0521483506 (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=144795</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Reed, S. J. B..<br /> Cambridge : Cambridge University Press, 1996 .<br /> xii, 201 p. : 26 cm..<br /> 0521483506 (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=144795">Place hold on <em>Electron microprobe analysis and scanning electron microscopy in geology /</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=144795</guid> </item> </channel> </rss>
