<?xml version="1.0" encoding="UTF-8"?>
<mods xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3" version="3.1" xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-1.xsd">
  <titleInfo>
    <title>Microwave measurements</title>
  </titleInfo>
  <name type="personal">
    <namePart>Bailey, A. E.</namePart>
  </name>
  <name type="corporate">
    <namePart>Institution of Electrical Engineers</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">London</placeTerm>
    </place>
    <publisher>Peter Peregrinus on behalf of the Institution of Electrical Engineers</publisher>
    <dateIssued>1989</dateIssued>
    <edition>2nd ed.</edition>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>xviii, 543 p. ; 24 cm.</extent>
  </physicalDescription>
  <note type="statement of responsibility">edited by A. E. Bailey.</note>
  <subject authority="lcsh">
    <topic>Microwave measurements</topic>
  </subject>
  <identifier type="isbn">0863411843 (hbk.)</identifier>
  <recordInfo>
    <recordContentSource authority="marcorg"/>
    <recordCreationDate encoding="marc">      </recordCreationDate>
    <recordChangeDate encoding="iso8601">20230123133243.0</recordChangeDate>
  </recordInfo>
</mods>
